The nGauge Atomic Force Microscope (AFM) is a power tool for characterization of polymers and composites. In three clicks, the nGauge is able to provide both topographical and mechanical data with high spatial accuracy.

Topography data is straightforward—this data is gathered by scanning across the sample to measure the height of features by repeatedly tapping each point with the AFM tip. This allows users to measure the size of features on samples with a high degree of precision.