Electronics

Electronics
Every year, hundreds of consumer electrical and electronic goods get recalled, dealing serious reputational and financial damages to brands and retailers. Electronics testing is done to not only determine the quality and safety of an electronic, as well to comply with international regulations.
Typical materials involved in advanced thin-film devices are semiconductors, metal alloys, dielectrics, oxides, and polymers. This mandates accurate monitoring and control of the device parameters using multiple investigation techniques. X-ray fluorescence (XRF) and X-ray diffraction (XRD) are an integral part of any such manufacturing process to monitor and control critical thin film parameters at every step equally important is the fine control over the process materials, like CMP slurry, which is an indispensable part of any thin-film device manufacturing. In most of these, the particle size and shape play an important role and need reliable characterization.
Measurement Types

Particle Size Distribution
Particle size analysis in the range 0.01-3500 microns. For nanoparticle analysis see dedicated section.

Morphology
Morphological analysis of particles in the range 0.5-10000 microns (size, shape and transparency of particles). Integrated Raman chemical analysis with MDRS (Morphologically Directed Raman Spectroscopy).

Nanoparticle Characterization
Size, concentration and zeta potential anlysis of nano-systems using light scattering techniques such as DLS, ELS and NTA techniques.

Rheology, Viscosity and Powder Flowability
Viscosity measurement and visco-elastic properties characterization of liquid dispersions, complex fluids and semi-solid materials.

Stability Analysis
Rapid and objective quantification of concentrated dispersion real stability using Multiple Light Scattering.

High Pressure Homogenizing
High pressure homogenizing technique to produce stable nanoemulsions, reduce particle size or molecular weight of polysaccharides, nanoencapsulation, de-agglomeration, etc.

Exosomes and EVs Characterization
Multiparametric characterization of exosomes and EVs including Sizing, Concentration per size range, Count, Phenotyping, Cargo, Integrity, Purity, etc.

Biomolecular Interactions
Biomolecular interactions of proteins, antibodies, nucleic acids, lipids and other biomolecules using ITC Microcalorimetry or BioLayer Interferometry BLI techniques.

Protein Aggregate Analysis
SEC is the standard method for protein aggregate analysis. The choice of pore size is related to the size of the molecule to be separated.

Elemental Analysis
XRF provides both qualitative and quantitative information on a wide variety of sample types. It can quantify elements from beryllium (Be) up to americium (Am) in concentrations from 100% down to sub-ppm level.
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