X-ray microscopy is a non-destructive technique that generates an image of the internal features of the examined materials, with the image contrast being determined by the difference in absorption of X-rays by the different components in the materials. The resolution of X-ray microscopy lies between that of light microscopy and electron microscopy since an X-ray microscope uses soft X-rays with a wavelength in the range of 10–0.01 nm. Further, because of their high energy, X-ray microscopes have the ability to penetrate relatively deep into materials, allowing images to be generated from the internal features. Compared to TEM, X-ray microscopy can generate images from relatively thick samples. A further advantage over electron microscopy is that X-ray microscopy does not require particular specimen preparation or a high-vacuum sample chamber.